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X-ray fluorescence analysis for very large samples.

    FISCHERSCOPE® X-RAY MODULAR CHAMBER


        Measuring on large workpieces. Large special housing for integrating Fischer X-ray measurement technology for measuring coating thickness and material analysis on large workpieces.
  • Large chamber for large samples
  • Flexible and modular scalable : Optimal for your application
  • Measuring table : Fixed or programmable
  • Reliable. : Precise measurement through measuring points on the entire sample surface
  • Think big. : Large chamber for large samples
  • Tailor-made.: Different models offer the optimal solution for your application and requirements; flexible and modularly scalable
  • Configurable. : Size and design according to your requirements
  • Proven software. : Fischer WinFTM® software guarantees you most comprehensive functionalities and measurement applications
  • 2 in 1 Robust enclosure and proven Fischer measurement technology

X-RAY MODULAR CHAMBER X-RAY MODULAR CHAMBER X-RAY MODULAR CHAMBER


Features
  • Integration of the FISCHERSCOPE ®instruments XDL®-XDLM® และXDAL®
  • Various detectors ensure very good detection accuracy and high resolution : Proportional counter tube, silicon PIN or silicon drift detector
  • Various X-ray tubes, filters and apertures, depending on the device
  • Various measuring tableoptions
  • Standard chamber size with approx. 1 m 3 and 1.5 m 3 orcustomized

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